USIP|xs

As the successor to the USIP 40 multi-channel defect detector, the newly available Krautkrämer USIP|xs CV solves a growing need for easy and cost-effective integration. The improved multi-instrument architecture helps optimize automation capabilities and provides more interfaces and flexibility. The USIP|xs CV can be integrated into any automated and semi-automated inspection system. With different T/R specifications and a multitude of channel configurations, the instrument is scalable in terms of both performance and associated costs. As a result, it is suitable for a wide range of applications and system sizes, such as Quality Control, Print Control, and R&D.